Simon Fraser University
Engaging the World

Course Outlines

Summer 2018 - ENSC 225 D100

Microelectronics I (4)

Class Number: 1082

Delivery Method: In Person

Overview

  • Course Times + Location:

    May 7 – Aug 3, 2018: Mon, 2:30–4:20 p.m.
    Burnaby

    May 7 – Aug 3, 2018: Wed, 2:30–4:20 p.m.
    Burnaby

  • Exam Times + Location:

    Aug 9, 2018
    Thu, 8:30–11:30 a.m.
    Burnaby

  • Instructor:

    Michael Adachi
    Office: ASB 8843

  • Prerequisites:

    (ENSC 220 or MSE 250), MATH 232, and MATH 310.

Description

CALENDAR DESCRIPTION:

This course teaches analog/digital electronics and basic device physics in the context of modern silicon integrated circuits technology. Topics include: qualitative device physics and terminal characteristics; implementations and models of basic semiconductor devices (diodes, BJTs and MOSFETs); circuit simulation via SPICE; basic diode circuits; transistors as amplifiers and switching elements; temperature effects and compensation; single-stage transistor amplifiers; biasing, current sources and mirrors. Students taking or with credit for ENSC 226 or MSE 251 may not take ENSC 225 for further credit. Quantitative.

COURSE DETAILS:

  1. Introduction: A brief review of selected topics from 220, frequency response, Bode plot, amplifier models.
  2. Operational Amplifiers: Review of ideal opamps, circuit configuration and applications. Non ideal performance, open-loop gain, open-loop and closed-loop frequency response, slew rate, input and output impedances, offset voltages and currents, common mode rejection ratio.
  3. Diode: Basic semiconductor concepts, physical operation of diodes. Ideal and real diodes, terminal characteristics, diode equations, temperature effects, non-linear characteristics and small signal analysis. Numerical solution of diode circuit, approximate solution and diode models. Applications - voltage regulator, rectifier, clipping, clamping circuits.
  4. Bipolar Junction Transistor (BJT): Physical structure and modes of operation, equivalent circuit, models, symbol, dc bias calculation and bias point stabilization. BJT as an amplifier,small signal model and analysis. Amplifier configurations. BJT as switch, saturation, model, Early voltage, nonideal and breakdown characteristics.
  5. Field Effect Transistor (FET): Physical structure and modes of operation of MOSFET and JFET. Enhancement and depletion mode FETs, terminal characteristics, circuit models. Biasing, amplifiers and analysis. Integrated MOS amplifiers (enhancement and depletion FET load), body effect, Early voltage and current mirror. FET as switch for analog and digital signals.
  6. Current steering circuits, differential amplifier configurations
Homework Policy:

Homework and Laboratory assignments will be posted on SFU Canvas (https://canvas.sfu.ca/). The completed assignments and Lab reports should be submitted through the Canvas website before their due dates. Late assignments and lab reports are subject to a 25% late penalty per day. Contact the instructor before the due date if there are extenuating circumstances.

Laboratories:

Laboratory experiments are an essential part of this course. The experiments will involve lab equipment located in Lab 1 and electronic components. Students must work in groups of 4 persons: each group will be given a bag of parts available from the resource office, and each group will submit one Lab report. All team members are expected to contribute equally to work required in the lab. Students should form lab teams during the first week of classes using the Canvas self sign-up feature in the “People” - “Lab Groups” tab. The “Discussions” page on Canvas can be used to post messages to the class, and may be helpful in finding group members.

Contact the instructor if helped is needed finding a lab team.

Grading

  • Laboratory (4 labs) 30%
  • Homework assignments 5%
  • Midterm Exams (2 exams, 12.5% each) 25%
  • Final exam (cumulative) 40%

NOTES:

Teaching Assistants (TAs):

Sheida Alan, sarabi@sfu.ca
Mohammadreza Yavari, myavari@sfu.ca
Chelsey Currie, ccurrie@sfu.ca
David Stevens, dms8@sfu.ca

Course website:

SFU Canvas (https://canvas.sfu.ca/)
Please check the site frequently for the latest information, Lab assignments, Homework assignments, etc.

If you miss an exam, the alternate exam will be more difficult. This is to ensure a fair treatment for the students who show-up during the scheduled exam time. All exams will be closed book examinations and you cannot bring any formula sheet or other assistive materials.

Rules:

The standard rules of examinations established by the university will apply for all exams. On top of that, there are a few additional rules you have to follow
1. You are allowed to bring writing tools (e.g. pen or pencil), a ruler, and a non-programmable scientific calculator to exams. Bringing anything else will constitute academic dishonesty.
2. No programmable calculators , computers, or tablets are allowed.
3. No cell phones or other electronic gadgets (e.g. head phones) are allowed.
4. No baseball caps or hats allowed. Religious head gear without an eye-shade can be worn.
5. All marked exam papers will be archived for Accreditation purposes.
6. During the exam you are not allowed to consult any hidden material or your neighbors. This will constitute academic dishonesty. Also, you are not allowed to render assistance to a fellow student either by physically helping or allowing a fellow student to see your exam paper. The violation of any of the rules will result in an F grade in the course for the candidate perpetrating the offense as well as the candidate assisting.

Materials

REQUIRED READING:

Adel S. Sedra, Kenneth C. Smith, “Microelectronic Circuits”, Oxford University Press, 7th Ed., 2015, ISBN 9780199339136 (ed. 6th is tolerable, eds. 5th and earlier are not recommended)
ISBN: 978-0199339136

RECOMMENDED READING:

Donald A. Neamen, Dhrubes Bswas, “Semiconductor Physics and Devices”, McGraw Hill Education, 4th Ed., 2011
ISBN: 978-0073529585

Richard S. Muller, Theodore I. Kamins, “Device Electronics for Integrated Circuits”, John Wiley & Sons, 3rd Revised Ed., 2002
ISBN: 978-0471593980

Registrar Notes:

SFU’s Academic Integrity web site http://students.sfu.ca/academicintegrity.html is filled with information on what is meant by academic dishonesty, where you can find resources to help with your studies and the consequences of cheating.  Check out the site for more information and videos that help explain the issues in plain English.

Each student is responsible for his or her conduct as it affects the University community.  Academic dishonesty, in whatever form, is ultimately destructive of the values of the University. Furthermore, it is unfair and discouraging to the majority of students who pursue their studies honestly. Scholarly integrity is required of all members of the University. http://www.sfu.ca/policies/gazette/student/s10-01.html

ACADEMIC INTEGRITY: YOUR WORK, YOUR SUCCESS