Atomic
Force Microscopy (AFM)
The Atomic Force Microscope (AFM) is a device in which the deflection
of a
sharp stylus mounted on a soft spring is monitored as the stylus is
moved across
a surface. If the deflection is kept constant by moving the stylus
up and down by
measured increments, the result (under favorable conditions) is an
atomic-resolution topographic map of the surface. Also termed a scanning
force
microscope. The AFM is capable of scanning to a resolution down to
the atomic
level and can also be used to manipulate atoms or molecules.
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last updated July
28, 1998
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