Description of Capabilities

• 0.2 - 30 keV field emission gun
  
• Focused Ion Beam (FIB)
  
• X-ray detector (EDS) (EDAX, Be detectable)
• SEM Resolution 3 nm (5 keV)
• Backscattered Electron Detector  (in lens)
• TEM cross-sectioning capabilities
• organometallic Pt source
• Fixed probe for transfer, and electrical measurements
• electron beam induced current (EBIC)
  
• fibre optical cable for light inputs
  
• (Funded by CFI/BCKDF, 2002)