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| Name | Last modified | Size |
|---|---|---|---|
| Parent Directory | - | |
| A37-Four-point-probe-measurement-of-semiconductor-sheet-resistance.pdf | 2009-01-06 21:26 | 335K |
| capone_critical_fields_APL1987.pdf | 2009-01-06 21:26 | 334K |
| dai_critical_field_YBCO_APL1987.pdf | 2009-01-06 21:26 | 411K |
| effects_of_field_uniformity.pdf | 2009-01-06 21:26 | 1.4M |
| Fundamentals of SQUID system.pdf | 2009-01-06 21:29 | 8.5M |
| kumakara_HTC_critical_field_JJAP1988.pdf | 2009-01-06 21:29 | 292K |
| panson_critical_current_APL1987.pdf | 2009-01-06 21:29 | 608K |
| schuetze_4_point_probe2004.pdf | 2009-01-06 21:29 | 219K |
| type_T_calibration_function.pdf | 2009-01-06 21:29 | 210K |
| wolfus_irreversible_mag_PRL1989.pdf | 2009-01-06 21:29 | 750K |
| wu_YBCO_PRL1987.pdf | 2009-01-06 21:29 | 368K |