USRA Seminar

Transmission He Ion Microscopy

Thursday, 06 July 2017 12:00PM PDT
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USRA Seminar
 
Karen Kavanagh
SFU Physics
 
Transmission He Ion Microscopy
 
Jul 06, 2017 at 12PM
 

Synopsis

Optical microscopy is a familiar method for magnifying objects on the micron scale. Better resolution is obtained by electron microscopy,  scanning or transmission techniques are commonly available. The latest electron microscopes regularly demonstrate spatial resolutions of 50 pm using planar waves or focused probes, easily resolving the atomic spacing of common materials, for example, silicon: 235 pm. But, considering the wavelength of a 200 keV electron beam (2 pm), there is still room for improvement, if resolution is limited by diffraction. What about using another type of charged beam, He+ ions. At 30 keV He ions have wavelengths of 20 fm which is on the scale of nuclear diameters (10 fm)? This talk will describe work at SFU developing our He ion microscope for applications in transmission microscopy.