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Structural Analysis of Materials PHYS 864 (3)

The application of transmission electron microscopy (TEM) and x-ray diffraction techniques to the study of the structure of materials. Hands-on instruction about the operation of a TEM and x-ray diffractometers is provided. The basic theory required for analyzing TEM and x-ray images and diffraction data is described. Prerequisite: Permission of instructor.

Section Instructor Day/Time Location
G100 Karen Kavanagh
Mo, We, Fr 12:30 PM – 1:20 PM
BLU 10901, Burnaby