Overview

Description

CALENDAR DESCRIPTION:

The application of transmission electron microscopy (TEM) and x-ray diffraction techniques to the study of the structure of materials. Hands-on instruction about the operation of a TEM and x-ray diffractometers is provided. The basic theory required for analyzing TEM and x-ray images and diffraction data is described.

COURSE DETAILS:

Objectives:  To understand the application of transmission electron microscopy (TEM) and x-ray diffraction techniques to the study of the structure of materials. To provide hands-on instruction on the operation of TEMs and x-ray diffractometers. To understand the basic theory required for analyzing TEM and x-ray images and diffraction data.

Labs:  Hand-on lab work is an essential part of the course and will consist of three labs: 

1. Polycrystalline specimen identification.
2. Single crystalline material investigation.
3. Special lab designed around each students own research

Course Outline:

Microstructure (What is the problem? How perfect is your material, crystalline defects)
Crystallography (What do we have and which direction are we going in?)
Basic Theory: Electron and X-Ray Scattering from Materials (Comparisons of the two)
Equipment Capabilities and Specifications (What can the instruments do and how to test them?)
Diffraction Patterns and Spectra Analysis (Simplest analysis problems)
Diffraction Contrast (Predominant source of contrast in a TEM image)
Reciprocal Space Maps (2-dimensional information, X-Ray diffraction image)
Phase Contrast (Fresnel fringes, lattice imaging)
Related Techniques (Scanning TEM, EELS, EDS, HAADF, CBD, E-Holgraphy and many others.)

Grading